AP-300
300mm Wafer Polishing, Oxide, Metal
Process Performance
- High-performance CMP process
- Advanced carrier with 5-zone pressure control
- All available 300mm CMP process
- In-situ and ex-situ pad conditioning(13zone)
- Carrier linear oscillation
- H.P rinse ▷dual type spray nozzle
Hardware Performance
- Spindle rotation control ▷DDR motor
- Trend data review
- Temp, motor torque
- CIP pad conditioner
- Calibration Table
- Model Description
Model | UNIT | Items | Type |
---|---|---|---|
AP 300™ | POLISH CARRIER (HEAD) | Motion | Rotation/Oscillation |
Head type | Membrane / Retainer Ring | ||
PLATEN | Motion | Rotation | |
Rotation Speed | MAX 190 rpm | ||
Pad | 30” | ||
CONDITIONER | Motion | Rotation / Sweep | |
Dressing | In/ Ex-situ | ||
DD size | 4 “ | ||
OTHERS | Slurry Supply | Top down | |
Pad Clean | High Pressure DIW | ||
Wafer In-Out | Dry In/Wet Out |