AP-200
100, 150, 200mm Wafer Polishing, Oxide, Metal
Process Performance
- In-situ and ex-situ pad conditioning(10zone)
- Carrier linear oscillation
- Membrane type CMP HEAD(4”,6”,8”)
- Overall uniformity of wafers is good
- Stable wafer polishing
Hardware Performance
- Head replacement work method is easy
- Various wafer sizes polishing
- Stable wafer polishing
- Wafer load cup
- Model Description
Model | UNIT | Items | Type |
---|---|---|---|
AP 200 | CARRIER | Motion | Rotation / Oscillation |
Head type | Membrane / Retainer Ring | ||
PLATEN | Motion | Rotation | |
Rotation Speed | MAX 200 rpm | ||
Pad | 20 inch | ||
CONDITIONER | Motion | Rotation / Sweep | |
Dressing | In / Ex-situ | ||
DD size | 4 “ | ||
OTHERS | Slurry Supply | Top down | |
Pad Clean | High Pressure DIW | ||
Wafer In-Out | Dry In/Wet Out |